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11/06/2010
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Sensor and sensing systems manufacturer, Sick UK, has launched a new series of displacement sensors which it says deliver precise high speed laser measurement of position, height and thickness.
 The OD Precision and OD Value sensors are designed to meet maximum accuracy and speed demands when measuring objects in the micron range. The OD series is suitable for a range of applications and is suitable for use in the electronics, automotive and packaging industries, as well as in robotics.
The sensors can be used to monitor the presence and position of objects as well as measuring profiles, diameters and width. According to Sick, the range can detect the slightest unevenness and the smallest deviation or indentation, making it suitable for use in quality inspection, where micron-accurate detection capability matters, such as in-line quality inspection, process regulation or product classification.
The OD Precision and OD Value can also be used to determine the thickness of glass, where only a single sensor head is required.
The OD series is IP67 protected and is taught via Sick's intuitive teach-in interface.
The OD Precision series offers a total of eight sensor head variants for five different measurement ranges, from 24-26mm to 300-700mm, and resolutions of micron accuracy. Short distance measurement sensor heads are available with a small or wide light spot, ensuring precise balance over a larger area and a wide range of materials, while eliminating the possibility of interference, from surface scratches for example.
The OD Precision series offers versatility in matching existing plant control systems with both NPN and PNP evaluation unit configurations. By combining values from up to three sensors through one controller, measurements such as thickness, planarity or centricity can be obtained.
Alternatively, the OD sensor head can be used as a stand-alone device without an evaluation unit, for example, in a robot or handling system, and integrated with the automated control system via an RS422 interface.
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Author
Chris Shaw
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