Both the ZeGage Pro and NewView 9000 leverage CSI to deliver fast, non-destructive, sub-nanometre measurements — regardless of surface type.
This makes them indispensable tools for industries that rely on surface precision, from semiconductors to optics, automotive, and aerospace.
ZeGage Pro: Compact Optical Metrology Solution
The ZeGage Pro brings Zygo’s optical metrology into a compact, benchtop form factor — ideal for shop floor deployment.
It provides 3D characterisation of micro- and nano-scale surface features. The NewView 9000 can analyse flatness, roughness, thin films, step heights, and more.
Innovative Accessories for Enhanced Performance
Zygo will be highlighting accessory innovations that extend performance and application reach. One standout is the 0.5x ZWF (Zygo Wide Field) objective, purpose-built to accelerate measurements across large areas.
With a field of view up to 35mm and a 45mm working distance, this objective is already transforming workflows in sectors like semiconductor inspection, AR waveguide metrology, and large-part precision machining. By significantly reducing stitching requirements, the 0.5x ZWF boosts throughput without compromising accuracy.
Zygo’s Commitment to Precision and Usability
“CONTROL is where quality meets innovation,” said Peter Kuschnir, European sales manager at Zygo.
“We’re excited to showcase how Zygo’s systems combine precision, speed, and usability. Whether you're inspecting an advanced optical assembly or need in-line process monitoring, we have the right tools and the right team to support you.”
