3D metrology for wide sample range

Written by: GE | Published:

The phoenix nanotom m, from GE´s Inspection Technologies business, has been developed to fulfill the fast growing demand for high resolution and high precision X-ray computed tomography (CT) in non-destructive 3D analysis and 3D metrology.

Featuring fully automated CT scan execution, volume reconstruction and the analysis process, it offers ease of use as well as fast and reproducible CT results, in applications ranging from small biological and geological samples to medium sized industrial components such as injection nozzles or injection molded plastic parts, even with metal inlays.

The nanotom m incorporates a new phoenix 180kV/15W, high-power nanofocus X-ray tube, which is optimized for long-term stability and allows scanning of high absorbing materials such as metals and ceramics. The internal cooling of the tube also significantly reduces thermal effects such as drift, to ensure even sharper imaging as well as allowing the long scanning times frequently required in scientific research.


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