Higher definition imaging and simplified operation: KEYENCE unveils its new VHX-6000 series digital microscope with adaptive multi-lighting
Recently launched by KEYENCE, the new VHX-6000 Series Digital Microscope integrates next-generation adaptive multi-lighting, advanced auto-focussing and high-definition imaging in an all-in-one system that will streamline and simplify quality inspection across all industries. SEE KEYENCE ON STAND A1.
Building upon the success of previous models and following close attention to customer feedback, KEYENCE has unveiled a new model that is easy-to-use yet offers much improved imaging with substantial time and cost saving benefits.
The VHX-6000 digital microscope features KEYENCE’s new adaptive multi-lighting function with its VH-ZST lens which features a 20x to 2000x magnification range. With no need for time-consuming sample repositioning, the direction and level of light is optimised as users simply move a digital flashlight icon around the screen for perfect illumination. By saving all the data with the image, this practical and time-saving function can even be applied after the image has been captured and saved to any compatible PC running VHX-6000 software - allowing users the ability to re-interpret images at any time, and importantly, at any location.
The VHX-6000 raises the bar for high resolution digital imaging in many other ways. Large area image observation at high magnification is now made possible with an image stitching algorithm that can synchronise positional information from the motorised XY. A large area 3D image stitching feature captures height data across an entire surface to combine it into a single stitched image that can help users to understand and measure profile changes.
With its magnification capability from 0.1x to 5000x through a choice of ten VH-series lenses, the VHX-6000 can be applied to stereoscopic, metallurgical, measuring and even electron-level microscopy. For automotive and metal industries, on-machine automated contamination and cleanliness analysis, compliant with ISO 16232 standards, is made possible for large area measurement. A comprehensive 40 page brochure detailing the full range of functions, features and options is available here: http://www.keyence.co.uk/1710eurekavhx
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