Precision thin films analysis

Written by: Ocean Optics | Published:
Precision thin films analysis

Ocean Optics' NanoCalc systems utilise spectroscopic reflectometry to accurately determine optical thin film thicknesses for consumer, semiconductor, medical and industrial applications.

Customer-designed and new application-ready preconfigured NanoCalc models make it easy to select the optimum system for deep UV to NIR wavelength measurement needs. NanoCalc systems are available for a range of wavelength, sampling method and optical layer thickness requirements (from 1.0 nm to 250 ┬Ám). Users can select among four standard models between ~200-1700 nm.

T: 0131 664 8122
keith.mitchell@photonicso


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